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Model
UP-X300 (serv.man45)
Pages
73
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3.62 MB
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PDF
Document
Service Manual
Brand
Device
EPOS / UP-X300 Service Manual
File
up-x300-sm45.pdf
Date

Sharp UP-X300 (serv.man45) Service Manual ▷ View online

UP-X300V
DIagnostics Specifications
3 – 11
(4) LCD attribute test execution display
When any key is pressed, the test is terminated and the display returns
to the menu of the test (1) above.
(5) VRAM test
Enter [SPACE] key to execute the VRAM verify test. (The display is colored in
12 colors.) Check the display and press any key to display the test result.
When [ESC] key is pressed, the display returns to the menu display. 
(6) LCD Brightness TEST screen
You can decrease the brightness by pressing the [
1] key and increase it by
pressing the [
3] key.
The display will be returned to the menu screen by pressing the [ESC] key.
4-6. RTC
4-6-1. General
This test is used to check the RTC (Real Time Clock).
The following test items are checked:
• RTC test: Calendar time alarm setting test, calendar time alarm data
read test, timer interruption test
• CMOS RAM test: Marching test, sequential write/read-verify test, RAM
display test, RAM battery backup test
•  Other functions: Error information display
4-6-2. Required Tools to be used
•  UP-X500 series main unit diag execution media   x 1
4-6-3. Test item
The purpose of this test are as follows:
4-6-4. Test contents
(1) Calendar & clock setup test
This test is used to set data of calendar, clock, and alarm for the RTC. 
(2) Calendar & clock real test
This test is used to read and display the calendar, clock, and alarm data
of the RTC.
(3) Timer interrupt test
This test is used to execute the update test of the RTC calendar and clock.
The following timer interrupt items are also checked:
• Periodic interrupt
• Alarm interrupt
• Update ended interrupt
(4)CMOS RAM marching test
Caution: During execution of this test, do not turn off the power and do
not reset the unit.
[Test condition setting]
• Error/Stop/Continue/1 pass
[Test contents]
The test pattern data are written into the area (Index address 0Eh - 7Eh) of
the CMOS RAM, and the read/verify test is executed.
After writing the data, the read/verify test is executed only once. 
There are four kinds of data pattern to be written: 00h, FFh, 55h, and AAh.
Writing the above four patterns form 1 pass. 
Before execution of the test, save all the data in the CMOS RAM. After exe-
cution of the test, restore the data to the CMOS RAM.
(5) CMOS RAM sequential write/read-verify test
Caution: During execution of this test, do not turn off the power and do
not reset the unit.
[Test condition setting]
• Error/Stop/Continue/1 pass
[Test contents]
The test pattern data are written into the area (Index address 0Eh -
7Eh) of the CMOS RAM, and the read/verify test is executed.
After writing the data, the read/verify test is executed twice.
Leave an interval (1 sec) between the first check and the second check. 
There are following patterns of data to be written: (Data of 1 pass)
Before execution of the test, save all the data in the RAM. After execu-
tion of the test, restore the data to the RAM.
BLACK
BLUE
GREEN
CYAN
RED
MAGENTA
BROWN
LIGHT-GRAY
DARK-GRAY
LIGHT-BLUE
LIGHT-GREEN
LIGHT-CYAN
LIGHT-RED
LIGHT-MAGENTA
YELLOW
WHITE WHITE
BLACK
BLUE
GREEN
CYAN
RED
MAGENTA
BROWN
LIGHT-GRAY
BLACK
BLUE
GREEN
CYAN
RED
MAGENTA
BROWN
LIGHT-GRAY
Press any key to exit
WHITE
Reverse
display
Blink
display
VRAM test
SPACE:Stop      ESC:Exit
LCD Brightness Test
Low - - - - - - - o - - - - High
Left: BrightnessDown         Right: BrightnessUp          ESC: Exit
Calendar & clock setup test
Calendar & clock read test
Timer interrupt test
CMOS RAM marching test
CMOS RAM sequential write/read-verify test
CMOS RAM display test
CMOS RAM battery backup test
Error table display
Calendar
Clock
Alarm
: Year/Month/Day/Day of week
: Hour/Minute/Second
: Hour/Minute/Second
Test pattern (I) 00h, 01h, 02h, 04h . . .  40h, 80h (9 patterns)
Test pattern (II) FFh, FEh, FDh, FBh . . .  BFh, 7Fn (9 patterns)
Test pattern (III) 00h, 01h, 02h, 03h . . .  FEh, FEh (256 patterns)
UP-X300V
DIagnostics Specifications
3 – 12
(6) CMOS RAM display test
All the data in all the areas (Index address: 00h - 7Fh) of the CMOS RAM
are displayed in HEX.
(7) CMOS TRAM battery backup test
This test is used to check the RTC control register Bit 7 (VRT bit), and check
changes in the CMOS RAM setting data and the data backup battery.
(8) Error table display
For service repair, the error information is saved in the DRAM, and data
saved in the DRAM are edited and displayed. When no error is found in
the previous tests (1) ~ (7), "OK" or "NO ERROR" is displayed. 
(9) Other supplementary note
In the marching test and the write/read-verify test, max. 20 errors are
recorded as the error information from selection of the function in chro-
nological order. No more error is recorded. 
4-6-5. Test menu
(1) RTC test menu display
On the above menu, use [
2 ] and [ 4 ] keys to select a test item. Press
[ENTER] key to execute the test. When [ESC] key is pressed, the dis-
play returns to the initial menu. 
(2) Calendar & clock setup test execution display
Enter the item numbers sequentially from the above with 10-key (0 ~ 9).
After entering all the three items (use [
3] key to skip) , select "OK" (use
[
1] key) in "CONFIRM (OK NO)" and press [ENTER] key. The data of
the three items are set in the CMOS RAM. 
(3) Calendar & clock read test execution display
The same display as shown at test (2) above.
Check that the data of "Second" in the item 2 is counted up every sec-
ond. If so, the test is OK.
(4) Timer internet test execution display
When "OK" is displayed for all the five items, the test is OK.
(5) CMOS RAM marching test execution display
Press [SPACE] key when [Checking] on the above display flashes. If
[OK] is displayed, the test is OK. 
(6) CMOS RAM sequential write/read-verify test
Similar to the test (5) above. 
(7) CMOS RAM display test execution display
The data in all the areas of the CMOS RAM are displayed in HEX. 
[XX: Data on the CMOS RAM]
1
YY-MM-DD
. . .Enter Year - Month - Day.
2, 3 HH-MM-SS
. . . Enter Hour - Minute - Second.
RTC & CMOS RAM CHECK
Calender & Clock Set_up Test
Calender & Clock Read Test
Timer Interrupt Test
CMOS RAM Marching Test
CMOS RAM Sequential Write/Read-Verify Test
CMOS RAM Display Test
CMOS RAM Battery Back_up Test
Error Table Display
:Move     ENTER:Select     ESC:Exit
Calender & Clock Set_up Test
Year,Month,Day (YY-MM-DD)=YY-MM-DD
Hours,Minutes (HH:MM:DD)=HH:MM:SS
Alarm Hour,Minutes (HH:MM:SS)=HH:MM:SS
:Move     0-9:Type     ESC:Exit
1
2
3
Timer Interrupt Test
RTC CHECK
CALENDER,CLOCK
PERIODIC INTR
ALARM INTR
UPDATE END INTR
ESC:Exit
OK
OK
OK
OK
OK
CMOS RAM Marching Test
[Error Stop Continue 1 pass]
ESC:Exit      SPACE:Stop      Start
MARCHING CHECK
Checking
OK
CMOS RAM Display Test
INDEX
ESC:Exit
8
10
18
20
28
30
38
40
48
50
58
60
68
70
78
address expressed
UP-X300V
DIagnostics Specifications
3 – 13
(8) CMOS RAM battery backup test execution display
Select the item 1 in [Pre_check] and press [ENTER] key, and the
former half of the check is executed and "Pre_Check end" is displayed. 
Turn off the power of the unit, and turn on to boot the same test.
Select the item 2 in [Check] and press [ENTER] key, and the last half of
the check is executed. If "OK" is displayed, the test is OK.
4-6-6. Error contents
4-7. LINE DISPLAY I/F
4-7-1. Outline
The customer line display (UP-P20DPB: Pole, UP-I20DP: Integrated) is
connected to execute the display test.
4-7-2. Required Tools to be used
4-7-3. Test item
Error table
4-7-4. Test contents
(1) Test pattern display test
The following test patterns are displayed on the line display sequentially.
Check that each test pattern is displayed properly. 
Pattern 1: All segments display
Pattern 2: Check pattern display
Pattern 3: Numerals (1 - 9), alphabet (A - G) display
Pattern 4: All segments delete
(2) Error table
The error content logged in the above (1). 
Error
code
Error message
0
OK!!
(The process is normally completed.)
1
Read calendar data dose not expect calendar data.
2
Read clock data does not expect clock data.
3
Periodic interrupt hasn't happened.
4
Alarm interrupt hasn't happened.
5
Update ended interrupt hasn't happened.
6
CMOS RAM a writed data hasn't coincide with a READED data.
(Data written into the RAM does not match check data.)
8
RTC battery is badness.
(The CMOS backup battery is defective.)
CMOS RAM Battery Back_up Test
[ Pre_check Check]
BATTERY CHECK......Checking   Pre_Check end
Machine power off please!!
ESC:Exit
1
[ Pre_check CHECK]
Press any key to Exit
BATTERY CHECK
OK
2
UP-X500 series main unit diag execution media
x 1
UP-P20DPB or UP-I20DP (Customer line display) x 1
•  The purposes of this test are as follows:
•  Test pattern display test
DBH ~ DBH
(Check the
dots signal)
Display ON command
Display data: 40 bytes
B2H ~ B2H
(Check the
dots signal)
Display data: 40 bytes
Display ON command
0
30H ~ 64H
2
9 A
d
(Check the
dots signal)
Display ON command
Display data: 40 bytes
0CH
Display OFF command
UP-X300V
DIagnostics Specifications
3 – 14
4-7-5. Test display
(1) Line display I/F test menu display
On the above menu, use [
2 ] and [ 4 ] keys to select a test item. Press
[ENTER] key to execute the test. When [ESC] key is pressed, the dis-
play returns to the initial menu. 
(2) Test pattern display execution display
The pattern No. line displayed on the line display is reversely displayed. 
When pattern 1 is displayed, the first line is reversely displayed. 
Every time when [ENTER] key is pressed, the next pattern is displayed. 
The sequence returns to pattern 1 from pattern 4.
When [ESC] key is pressed, the display returns to the above menu display (1). 
4-7-6. Error contents
(1) Send time out
Data cannot be written into PCP3 send register.
(2) Receive time out
PCP3 does not send a response. 
(3) Response error 
Command response error
4-8. Drawer I/F
4-8-1. General
The drawer magnet is connected to execute signal check.
4-8-2. Required Tools to be used
•  UP-X500 main unit diag execution media x 1
• Drawer magnet
4-8-3. Test contents
The purposes of this test are as follows:
(1) Drawer open test (Channel 1)
In this test, the drawer magnet channel 1 (drawer open) signal is turned on.
(2) Drawer open test (Channel 2)
In this test, the drawer magnet channel 2 (drawer open) signal is turned on.
(3) Drawer sense test
This test senses open state of the drawer magnet channel 1 and channel 2.
4-8-4. Test display
(1) Drawer I/F test channel 1 & 2 menu display
On the above menu, use [
2 ] and [ 4 ] keys to select a test item. Press
[ENTER] key to execute the test. When [ESC] key is pressed, the dis-
play returns to the initial menu. 
(2) Drawer Sense TEST
The operating status of each drawer channel is displayed.
You can return to the menu screen by pressing the [ESC] key.
4-8-5. Error contents
(1) Drawer open test
(1) Send time out
Data cannot be written into PCP3 send register.
(2) Receive time out
PCP3 does not send a response. 
(3) Response error
Command response error
4-9. Buzzer
4-9-1. Test Description
The buzzer rings. 
4-9-2. Required Tools to be used
•  UP-X500 series main unit diag execution media   x 1
•  Drawer open test (Channel 1)
•  Drawer open test (Channel 2)
• Drawer sense test
LINE DISPLAY I/F TEST
TEST PATTERN DISPLAY TEST
ERROR TABLE
:MOVE ENTER:SELECT:ESC:Exit
TEST PATTERN DISPLAY TEST
PATTERN 1 DISPLAY
PATTERN 2 DISPLAY
PATTERN 3 DISPLAY
PATTERN 4 DISPLAY
CHECK LINE DISPLAY
ESC:Exit       ENTER:Executeuet
Error display area
DRAWER I/F TEST
DRAWER OPEN TEST
Check Magnet Action
ENTER:Execute       ESC:EXIT
D
䌲䌡䌷䌥䌲 䌉/䌆 䌔䌥䌳䌴 
Drawer Sence Test
 
Drawer Channel 0 : OPEN (or CLOSE)
Drawer Channel 1 : OPEN (or CLOSE)
ESC : Exit
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