Sharp UP-X500 (serv.man4) Service Manual ▷ View online
UP-X500U
DIagnostics Specifications
4 – 10
When [ESC] key of 106 keyboard is pressed twice continuously, the dis-
play returns to the menu of the above (1).
play returns to the menu of the above (1).
4-4-6. Error contents
(1) 106 keyboard check
• Parity error
(This error occurs when the serial data from the keyboard is of even parity.)
• Key recognizer error
(This error occurs when the entered key code cannot be recognized.)
4-5. VGA I/F & LCD
4-5-1. General
This test is used to check whether the VGA I/F section and the LCD
panel function normally or not. Selection of aging/error stop/1 pass can
be made. The test execution time is also displayed.
panel function normally or not. Selection of aging/error stop/1 pass can
be made. The test execution time is also displayed.
*
Since the VGA test is executed for all display area, when the VGA test
item is selected, the display mode is switched to the all display mode.
item is selected, the display mode is switched to the all display mode.
4-5-2. Jig to be used
• UP-X500 series main unit diag execution media x 1
4-5-3. Test item
The purposes of this test are as follows:
4-5-4. Test contents (for service repair)
(1) Test pattern display test
The LCD display test is executed in the following sequence:
(2) LCD backlight ON/OFF test
This test is used to check ON/OFF of the LCD backlight.
The test procedures are as follows:
(3) LCD attribute test
This test is used to check 18-color display and 8-color reverse and
blinking display.
(4) VRAM test
This test is used to execute the VRAM (1MB) memory verify test.
(5) LCD brightness test
(6) Error table
The errors occurred in the previous tests (1) ~ (5) are displayed for each
test item.
4-5-5. Test menu
(1) VGA I/F & LCD test menu
On the above display, use [
2
] and [
4
] keys to select a test item. When
[ENTER] key is pressed, the test is executed. When [ESC] key is
pressed, the display returns to the initial menu.
(2) Test pattern display test execution display
Refer to 5-5-4. (1).
(3) LCD backlight ON/OFF execution display
ON/OFF of the backlight is repeated in a certain frequency.
When [SPACE] key is pressed during this test, the test is interrupted.
When [SPACE] key is pressed during interruption, the test is resumed.
When [ESC] key is pressed, the test is terminated and the display
returns to the initial menu.
• Test pattern display
• LCD backlight ON/OFF test
• LCD attribute test
• VRAM test
• Brightness test
• Error table
Test for
1 pass
1 pass
All dot Black
(Check that all the display is black.)
(Check that all the display is black.)
All dot Black
(Check that all the display is black.)
(Check that all the display is black.)
All-dot white
(Check that all the display is white.)
(Check that all the display is white.)
8-dot unit check pattern display
8-dot unit
8-dot unit
Peripheral 1-dot display
Test for 1 pass
Backlight ON
4
Backlight OFF
LCD & VGA Diagnostics
Test Pattern display
LCD Reverse Display test
LCD Back-Light ON/OFF test
LCD Attribute test
:Move ENTER:Select ESC:Exit
Error table
VRAM test
LCD Back-Light ON/OFF Test
ON
(OFF)
SPACE:Stop
ESC:Exit
UP-X500U
DIagnostics Specifications
4 – 11
(4) LCD attribute test execution display
When any key is pressed, the test is terminated and the display returns
to the menu of the above (1).
to the menu of the above (1).
(5) VRAM test
Enter [SPACE] key to execute the VRAM verify test. (The display is colored in
12 colors.) Check the display and press any key to display the test result.
When [ESC] key is pressed, the display returns to the menu display.
12 colors.) Check the display and press any key to display the test result.
When [ESC] key is pressed, the display returns to the menu display.
(6) LCD Brightness TEST screen
You can decrease the brightness by pressing the [
1
] key and increase it
by pressing the [
3
] key.
The display will be returned to the menu screen by pressing the [ESC] key.
4-6. RTC
4-6-1. General
This test is used to check the RTC (Real Time Clock).
The following test items are checked:
The following test items are checked:
• RTC test: Calendar time alarm setting test, calendar time alarm data
read test, timer interruption test
• CMOS RAM test: Marching test, sequential write/read-verify test, RAM
display test, RAM battery backup test
• Other functions: Error information display
4-6-2. Jig to be used
• UP-X500 series main unit diag execution media x 1
4-6-3. Test item
The purposes of this test are as follows:
4-6-4. Test contents
(1) Calendar & clock setup test
This test is used to set data of calendar, clock, and alarm for the RTC.
(2) Calendar & clock real test
This test is used to read and display the calendar, clock, and alarm data
of the RTC.
(3) Timer interrupt test
This test is used to execute the update test of the RTC calendar and clock.
The following timer interrupt items are also checked:
• Periodic interrupt
• Alarm interrupt
• Update ended interrupt
(4)CMOS RAM marching test
Caution: During execution of this test, do not turn off the power and do
not reset the unit.
[Test condition setting]
• Error/Stop/Continue/1 pass
[Test contents]
The test pattern data are written into the area (Index address 0Eh - 7Eh) of
the CMOS RAM, and the read/verify test is executed.
After writing the data, the read/verify test is executed only once.
There are four kinds of data pattern to be written: 00h, FFh, 55h, and AAh.
There are four kinds of data pattern to be written: 00h, FFh, 55h, and AAh.
Writing the above four patterns form 1 pass.
Before execution of the test, save all the data in the CMOS RAM. After exe-
cution of the test, restore the data to the CMOS RAM.
cution of the test, restore the data to the CMOS RAM.
(5) CMOS RAM sequential write/read-verify test
Caution: During execution of this test, do not turn off the power and do
not reset the unit.
[Test condition setting]
• Error/Stop/Continue/1 pass
[Test contents]
The test pattern data are written into the area (Index address 0Eh -
7Eh) of the CMOS RAM, and the read/verify test is executed.
7Eh) of the CMOS RAM, and the read/verify test is executed.
After writing the data, the read/verify test is executed twice.
Leave an interval (1 sec) between the first check and the second check.
There are following patterns of data to be written: (Data of 1 pass)
There are following patterns of data to be written: (Data of 1 pass)
Before execution of the test, save all the data in the RAM. After execu-
tion of the test, restore the data to the RAM.
BLACK
BLUE
GREEN
CYAN
RED
MAGENTA
BROWN
LIGHT-GRAY
BLUE
GREEN
CYAN
RED
MAGENTA
BROWN
LIGHT-GRAY
DARK-GRAY
LIGHT-BLUE
LIGHT-GREEN
LIGHT-CYAN
LIGHT-RED
LIGHT-MAGENTA
YELLOW
WHITE WHITE
LIGHT-BLUE
LIGHT-GREEN
LIGHT-CYAN
LIGHT-RED
LIGHT-MAGENTA
YELLOW
WHITE WHITE
BLACK
BLUE
GREEN
CYAN
BLUE
GREEN
CYAN
RED
MAGENTA
BROWN
LIGHT-GRAY
MAGENTA
BROWN
LIGHT-GRAY
BLACK
BLUE
GREEN
BLUE
GREEN
CYAN
RED
MAGENTA
BROWN
LIGHT-GRAY
RED
MAGENTA
BROWN
LIGHT-GRAY
Press any key to exit
WHITE
Reverse
display
display
Blink
display
display
VRAM test
SPACE:Stop ESC:Exit
LCD Brightness Test
Low - - - - - - - o - - - - High
Left: BrightnessDown Right: BrightnessUp ESC: Exit
Calendar & clock setup test
Calendar & clock read test
Timer interrupt test
CMOS RAM marching test
CMOS RAM marching test
CMOS RAM sequential write/read-verify test
CMOS RAM display test
CMOS RAM battery backup test
Error table display
Error table display
Calendar
Clock
Clock
Alarm
: Year/Month/Day/Day of week
: Hour/Minute/Second
: Hour/Minute/Second
: Hour/Minute/Second
Test pattern (
I
) 00h, 01h, 02h, 04h . . . 40h, 80h (9 patterns)
Test pattern (
II
) FFh, FEh, FDh, FBh . . . BFh, 7Fn (9 patterns)
Test pattern (
III
) 00h, 01h, 02h, 03h . . . FEh, FEh (256 patterns)
UP-X500U
DIagnostics Specifications
4 – 12
(6) CMOS RAM display test
All the data in all the areas (Index address: 00h - 7Fh) of the CMOS RAM
are displayed in HEX.
(7) CMOS TRAM battery backup test
This test is used to check the RTC control register Bit 7 (VRT bit), and check
changes in the CMOS RAM setting data and the data backup battery.
(8) Error table display
For service repair, the error information is saved in the DRAM, and data
saved in the DRAM are edited and displayed. When no error is found in
the previous tests (1) ~ (7), "OK" or "NO ERROR" is displayed.
(9) Other supplementary note
In the marching test and the write/read-verify test, max. 20 errors are
recorded as the error information from selection of the function in chro-
recorded as the error information from selection of the function in chro-
nological order. No more error is recorded.
4-6-5. Test menu
(1) RTC test menu display
On the above menu, use [
2
] and [
4
] keys to select a test item. Press
[ENTER] key to execute the test. When [ESC] key is pressed, the dis-
play returns to the initial menu.
(2) Calendar & clock setup test execution display
Enter the item umbers sequentially from the above with 10-key (0 ~ 9).
After entering all the three items (use [
3
] key to skip) , select "OK" (use
[
1
] key) in "CONFIRM (OK NO)" and press [ENTER] key. The data of
the three items are set in the CMOS RAM.
(3) Calendar & clock read test execution display
The same display as the above (2) is shown.
Check that the data of "Second" in the item
Check that the data of "Second" in the item
2
is counted up every sec-
ond. If so, the test is OK.
(4) Timer internet test execution display
When "OK" is displayed for all the five items, the test is OK.
(5) CMOS RAM marching test execution display
Press [SPACE] key when [Checking] on the above display flashes. If
[OK] is displayed, the test is OK.
(6) CMOS RAM sequential write/read-verify test
Similar to the above (5).
(7) CMOS RAM display test execution display
The data in all the areas of the CMOS RAM are displayed in HEX.
[XX: Data on the CMOS RAM]
1
YY-MM-DD
. . .Enter Year - Month - Day.
2
,
3
HH-MM-SS
. . . Enter Hour - Minute - Second.
RTC & CMOS RAM CHECK
Calender & Clock Set_up Test
Calender & Clock Read Test
Timer Interrupt Test
CMOS RAM Marching Test
Calender & Clock Read Test
Timer Interrupt Test
CMOS RAM Marching Test
CMOS RAM Sequential Write/Read-Verify Test
CMOS RAM Display Test
CMOS RAM Display Test
CMOS RAM Battery Back_up Test
Error Table Display
:Move ENTER:Select ESC:Exit
Calender & Clock Set_up Test
Year,Month,Day (YY-MM-DD)=YY-MM-DD
Hours,Minutes (HH:MM:DD)=HH:MM:SS
Alarm Hour,Minutes (HH:MM:SS)=HH:MM:SS
:Move 0-9:Type ESC:Exit
1
2
3
Timer Interrupt Test
RTC CHECK
CALENDER,CLOCK
PERIODIC INTR
ALARM INTR
UPDATE END INTR
ESC:Exit
OK
OK
OK
OK
OK
CMOS RAM Marching Test
[Error Stop Continue 1 pass]
ESC:Exit SPACE:Stop Start
MARCHING CHECK
Checking
OK
CMOS RAM Display Test
INDEX
ESC:Exit
8
10
18
20
28
30
38
40
48
50
58
60
68
70
78
address expressed
UP-X500U
DIagnostics Specifications
4 – 13
(8) CMOS RAM battery backup test execution display
Select the item
1
in [Pre_check] and press [ENTER] key, and the
former half of the check is executed and "Pre_Check end" is displayed.
Turn off the power of the unit, and turn on to boot the same test.
Select the item
2
in [Check] and press [ENTER] key, and the last half
of the check is executed. If "OK" is displayed, the test is OK.
4-6-6. Error contents
4-7. CENTRO I/F (AT)
4-7-1. Outline
This test is used to check whether the Centro I/F section functions nor-
mally or not. This test checks contact of the signal pins and the Centro I/
F troubles. Selection of aging/error stop/1 pass can be made for each
test item, and the test time is displayed.
mally or not. This test checks contact of the signal pins and the Centro I/
F troubles. Selection of aging/error stop/1 pass can be made for each
test item, and the test time is displayed.
4-7-2. Jig to be used
• Centro shorter (UPOG-2366BHZZ)
• UP-X500 series main unit diag execution media
4-7-3. Test items
The purposes of this test are as follows:
4-7-4. test contents
(1) Signal line test (without loop-back connector)
The signal test is executed without a shorter (loop-back connector) to
check for connection of signal lines.
check for connection of signal lines.
Change the following signals and check that the other signals are not
affected or not.
Strobe, Autofeed, Init, SLCTIN, ERROR, SLCT, PE, ACK, Busy
Strobe, Autofeed, Init, SLCTIN, ERROR, SLCT, PE, ACK, Busy
(2) Signal line test (with loop-back connector)
Use a shorter (loop-back connector) to execute loop-back test of the sig-
nals to check Enable/Disable control of each signal line is possible or not.
Change the following signals and check changes in the signals.
Change the following signals and check changes in the signals.
Strobe, Autofeed, Init, SLCTIN, ERROR, SLCT, PE, ACK, Busy
Error
code
code
Error message
0
OK!!
(The process is normally completed.)
(The process is normally completed.)
1
Readed calendar data dose not expect calendar data.
(Read calendar data does not match the expected calendar data.)
(Read calendar data does not match the expected calendar data.)
2
Readed clock data does not expect clock data.
(Read clock data does not match the expected clock data.)
(Read clock data does not match the expected clock data.)
3
Periodic interrupt hasn't happened.
(Periodic interrupt hasn't happened.)
(Periodic interrupt hasn't happened.)
4
Alarm interrupt hasn't happened.
(Alarm interrupt hasn't happened.)
(Alarm interrupt hasn't happened.)
5
Update ended interrupt hasn't happened.
(Update ended interrupt hasn't happened.)
(Update ended interrupt hasn't happened.)
6
CMOS RAM a writed data hasn't coincide with a READED data.
(Data written into the RAM does not match check data.)
(Data written into the RAM does not match check data.)
8
RTC battery is badness.
(The CMOS backup battery is defective.)
(The CMOS backup battery is defective.)
CMOS RAM Battery Back_up Test
[ Pre_check Check]
BATTERY CHECK......Checking Pre_Check end
Machine power off please!!
ESC:Exit
1
[ Pre_check CHECK]
Press any key to Exit
BATTERY CHECK
OK
2
• Signal line test (without loop-back connector)
• Signal line test (with loop-back connector)
• Sense printer status check
• All characters print check
• Dummy printer test (with dummy printer)
• Error table
STOROBE#
D0
D1
D2
D3
D4
D5
D6
D7
ACK
BUSY
PE
SLCT
AF#
ERROR#
INIT#
SLCTIN#
GND
GND
GND
GND
GND
GND
GND
GND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
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