JBL ES 150PW (serv.man4) EMC - CB Certificate ▷ View online
ELECTRONICS TESTING CENTER(ETC), TAIWAN
File No. : 08-07-RBF-038-01
EMC TESTING DEPARTMENT II
Page: 8 / 42
3 SUMMARY OF TEST RESULTS
3.1 Emissions:
3.1.1 Conducted Emissions
[X] – PASS (AV In -Neutral)
Minimum EMI QP Margin to the limit:
Minimum EMI QP Margin to the limit:
-13.6 dB at
1.843 MHz
[X] – PASS (AV In -Line)
Minimum EMI QP Margin to the limit:
Minimum EMI QP Margin to the limit:
-13.9 dB at
1.851 MHz
[X] – PASS (Link In -Neutral)
Minimum EMI QP Margin to the limit:
Minimum EMI QP Margin to the limit:
-23.6 dB at
1.476 MHz
[X] – PASS (Link In -Line)
Minimum EMI QP Margin to the limit:
Minimum EMI QP Margin to the limit:
-19.4 dB at
1.476 MHz
3.1.2 Radiated Emissions
[X] – PASS (AV In -HOR)
Minimum EMI Margin to the limit:
Minimum EMI Margin to the limit:
-9.3 dB at
157.370 MHz
[X] – PASS (AV In -VER)
Minimum EMI Margin to the limit:
Minimum EMI Margin to the limit:
-11.0 dB at
184.470 MHz
[X] – PASS (Link In -HOR)
Minimum EMI Margin to the limit:
Minimum EMI Margin to the limit:
-8.8 dB at
171.730 MHz
[X] – PASS (Link In -VER)
Minimum EMI Margin to the limit:
Minimum EMI Margin to the limit:
-10.4 dB at
159.540 MHz
3.1.3 Harmonics Current Emissions
[X] – PASS
The harmonics current values were under the limits of the class A equipment of the
EN 61000-3-2.
The harmonics current values were under the limits of the class A equipment of the
EN 61000-3-2.
3.1.4 Voltage Fluctuations and Flicker
[X] – PASS
The voltage fluctuations and flicker values were under the limits of the
EN 61000-3-3 requirements.
The voltage fluctuations and flicker values were under the limits of the
EN 61000-3-3 requirements.
ELECTRONICS TESTING CENTER(ETC), TAIWAN
File No. : 08-07-RBF-038-01
EMC TESTING DEPARTMENT II
Page: 9 / 42
3.2 Immunity:
3.2.1 Immunity Criteria:
The results of all of the immunity tests performed on the EUT were evaluated according to the
following criteria, and according to the manufacturer’s specifications for the EUT:
Performance criterion CT : The performance criteria A shall apply. Tests shall be repeated
following criteria, and according to the manufacturer’s specifications for the EUT:
Performance criterion CT : The performance criteria A shall apply. Tests shall be repeated
with the EUT in standby mode (if applicable) to ensure that
unintentional transmission does not occur. In systems using
acknowledgement signals, it is recognized that an
ACKnowledgement (ACK) or Not ACKnowlegdgement
(NACK) transmission may occur, and steps should be taken to
ensure that any transmission resulting from the application of
the correctly interpreted.
unintentional transmission does not occur. In systems using
acknowledgement signals, it is recognized that an
ACKnowledgement (ACK) or Not ACKnowlegdgement
(NACK) transmission may occur, and steps should be taken to
ensure that any transmission resulting from the application of
the correctly interpreted.
Performance criterion TT : The performance criteria B shall apply, except for voltage dips
of 100 ms and voltage interruptions of 5000ms duration, for
which performance criteria C shall apply. Tests shall be
repeated with the EUT in standby mode (if applicable) to ensure
that unintentional transmission does not occur. Iin systems
using acknowledgement signals, it is recognized that an
acknowledgement (ACK) or notacknowledgement (NACK)
transmission may occur, and steps should be taken to that any
transmission resulting from the application of the test is
correctly interpreted.
which performance criteria C shall apply. Tests shall be
repeated with the EUT in standby mode (if applicable) to ensure
that unintentional transmission does not occur. Iin systems
using acknowledgement signals, it is recognized that an
acknowledgement (ACK) or notacknowledgement (NACK)
transmission may occur, and steps should be taken to that any
transmission resulting from the application of the test is
correctly interpreted.
Performance criterion CR: The performance criteria A shall apply. Where the EUT is a
transceiver, under no circumstances, shall the transmitter
operate unintentionally during the test. In systems using
acknowledgement signals, it is recognized that an ACK or
NACK transmission may occur, and steps should be taken to
ensure that any transmission resulting from the application of
the test is correctly interpreted.
operate unintentionally during the test. In systems using
acknowledgement signals, it is recognized that an ACK or
NACK transmission may occur, and steps should be taken to
ensure that any transmission resulting from the application of
the test is correctly interpreted.
Performance criterion TR: The performance criteria B shall apply, except for voltage dips
of 100 ms and voltage interruptions of 5000ms duration for
which performance criteria C shall apply. Where the EUT is a
transceiver, under no circumstances, shall the transmitter
operate unintentionally during the test. In systems using
acknowledgement signals, it is recognized that an ACK or
NACK transmission may occur, and steps should be taken to
ensure that any transmission resulting from the application of
test is correctly interpreted.
which performance criteria C shall apply. Where the EUT is a
transceiver, under no circumstances, shall the transmitter
operate unintentionally during the test. In systems using
acknowledgement signals, it is recognized that an ACK or
NACK transmission may occur, and steps should be taken to
ensure that any transmission resulting from the application of
test is correctly interpreted.
ELECTRONICS TESTING CENTER(ETC), TAIWAN
File No. : 08-07-RBF-038-01
EMC TESTING DEPARTMENT II
Page: 10 / 42
Performance table
Criteria
During test
After test
A
Shall operate as intended
May show degradation of performance
(note 1)
Shall be no loss of function
Shall be no unintentional transmissions
May show degradation of performance
(note 1)
Shall be no loss of function
Shall be no unintentional transmissions
Shall operate as intended
Shall be no degradation of performance (note 2)
Shall be no loss of function
Shall be no loss of stored data or user programmable
functions
Shall be no degradation of performance (note 2)
Shall be no loss of function
Shall be no loss of stored data or user programmable
functions
B
May show loss of function (one or more)
May show degradation of performance
(note 1)
No unintentional transmissions
May show degradation of performance
(note 1)
No unintentional transmissions
Functions shall be self-recoverable
Shall operate as intended after recovering
Shall be no degradation of performance (note 2)
Shall be no loss of stored data or user programmable
functions
Shall operate as intended after recovering
Shall be no degradation of performance (note 2)
Shall be no loss of stored data or user programmable
functions
C
May be loss function (one ot more)
Functions shall be recoverable by the operator
Shall operate as intended after recovering
Shall be no degradation of performance (note 2)
Shall operate as intended after recovering
Shall be no degradation of performance (note 2)
Note1:Degradation of performance during the test is understood as a degradation to a level not below a
minimum performance level specified by the manufacturer for the use of the apparatus as intended. Iin
some cases the specified minimum performance level may be replaced by a permissible degradation or
performance.
If the minimum performance level or the permissible performance degradation is not specified by the
manufacturer then either of these may be derived from the product description and documentation
(including leaflets and advertising) and what the user may reasonably expect from the apparatus if
used as intended.
some cases the specified minimum performance level may be replaced by a permissible degradation or
performance.
If the minimum performance level or the permissible performance degradation is not specified by the
manufacturer then either of these may be derived from the product description and documentation
(including leaflets and advertising) and what the user may reasonably expect from the apparatus if
used as intended.
Note2:No degradation of performance of performance after the test is understood as no degradation below a
minimum performance level specified by the manufacture for the use of the apparatus as intended. In
some cases the specified minimum performance level may be replaced by a permissible degradation of
performance. After the test no change of actual operating data or user retrievable data is allowed. If the
minimum performance level or the permissible performance degradation is not specified by the
manufacture then either of these may be derived from the product description and documentation
(including leaflets and advertising) and what the user may reasonably expect from the apparatus if
used as intended.
some cases the specified minimum performance level may be replaced by a permissible degradation of
performance. After the test no change of actual operating data or user retrievable data is allowed. If the
minimum performance level or the permissible performance degradation is not specified by the
manufacture then either of these may be derived from the product description and documentation
(including leaflets and advertising) and what the user may reasonably expect from the apparatus if
used as intended.
3.2.2 Electrostatic Discharge Immunity:
Requirement :Criterion B (or better)
[X] applicable
[ ] not applicable
Requirement
:Criteria
[X] TT
[X] TR
-Satisfies criterion
[X] A
[ ] B
3.2.3 RF Radiated Fields Immunity:
Requirement
:Criterion
A
[X] applicable
[ ] not applicable
Requirement
:Criteria
[X] CT
[X] CR
-Satisfies criterion
[X] A
[ ] B
ELECTRONICS TESTING CENTER(ETC), TAIWAN
File No. : 08-07-RBF-038-01
EMC TESTING DEPARTMENT II
Page: 11 / 42
3.2.4 EFT/Burst Immunity:
Requirement :Criterion B (or better)
[X] applicable
[ ] not applicable
Requirement
:Criteria
[X] TT
[X] TR
-Satisfies criterion
[ ] A
[X] B
3.2.5 Surge Immunity:
Requirement :Criterion B (or better)
[X] applicable
[ ] not applicable
Requirement
:Criteria
[X] TT
[X] TR
-Satisfies criterion
[X] A
[ ] B
3.2.6 RF Common Mode Immunity:
Requirement :Criterion A
[X] applicable
[ ] not applicable
Requirement
:Criteria
[X] CT
[X] CR
-Satisfies criterion
[X] A
[ ] B
3.2.7 Voltage Interruptions and Voltage Dips Immunity:
Requirement :Criterion C (or better)
[X] applicable
[ ] not applicable
Requirement
:Criteria
[X] TT
[X] TR
-Satisfies criterion
[X] A
[ ] B
[ ] C
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