JBL DUET II (serv.man5) EMC - CB Certificate ▷ View online
Ident. Nr.:
114383
Date:
2008-11-09
114383 EMC TRF.doc
page 5 of 38
1 Summary
Emission
1.1 Standards
Generic standard
EN61000-3-3:1995+A1:2001+A2:2005
EN61000-3-2:2006
Product or product family standard
EN 55022:2006
Product category
Table-top
1.2 Results
Environmental
phenomena
phenomena
Port / Test module
Basic standard
and test setup
and test setup
Limit class
Result
Conducted emission
Input AC power ports
CISPR 16 /
CISPR 22
CISPR 22
Table 2 of CISPR 22: 2005
– Class B
Pass
Radiated emission
Enclosure
CISPR 16 /
CISPR 22
CISPR 22
Table 6 (3m) of CISPR 22:
2005 – Class B
Pass
Harmonic current
emission
emission
AC input power ports
EN 61000-3-2
Class A
Pass*
Voltage fluctuations
and flicker
and flicker
AC input power ports
EN 61000-3-3
Clause 5
of
EN61000-3-3
Pass **
*)
For devices with a rated power of less 75 W , not being lighting equipment, no limit values are effective.
(EN61000-3-2)
(EN61000-3-2)
For professionally used devices with a total rated power exceeding 1 kW no limit values are effective.
(EN61000-3-2)
(EN61000-3-2)
**)
There is no testing required if the device does not generate any significant voltage fluctuations or flicker.
(EN61000-3-3)
A short time measurement confirmed the assumption that this is the fact. The details in the test module
are representing the results of the short time measurement.
(EN61000-3-3)
A short time measurement confirmed the assumption that this is the fact. The details in the test module
are representing the results of the short time measurement.
Ident. Nr.:
114383
Date:
2008-11-09
114383 EMC TRF.doc
page 6 of 38
2 Summary
Immunity
2.1 Standards
Generic standard
As below
Product or product family standard
EN55024:1998+A1:2001+A2:2003
Product category:
/
Performance criteria:
see table below
2.2 Results
Environmental
phenomena
phenomena
Port / Test module
Generic standard and test
setup
setup
Performance criteria
Result
Electrostatic
discharge, ESD
discharge, ESD
Enclosure
EN 61000-4-2:1995/A1：
1998/A2：2001
B Pass
Radiated immunity
Enclosure
80 - 1000 MHz
80 - 1000 MHz
EN 61000-4-3:2006
A Pass
Electrical Fast
Transients/Bursts
Immunity
Transients/Bursts
Immunity
Input AC power ports
EN 61000-4-4:2004
B Pass
Surge Immunity
Input AC power ports
EN 61000-4-5:2006
B Pass
Conducted Immunity
Input AC power ports
EN 61000-4-6:1996/A1:2001
A Pass
Voltage dips and
interruptions
Immunity
interruptions
Immunity
Input AC power ports
EN 61000-4-11:2004
B for 0% 0.5
C for 0% 250
C for 70% 25
Pass
Power frequency
magnetic fields
Enclosure port
EN 61000-4-8:1993/A1:2001
A
N/A***
***)
No magnetic sensitive components ,so not applicable .
2.3 Performance criteria according to product or product family standards
Performance criterion A
The equipment shall continue to operate as intended without operator intervention. No degradation
of performance or loss of function is allowed below a performance level specified by the
manufacturer when the equipment is used as intended. The performance level may be replaced by a
permissible loss of performance. If the minimum performance level or the permissible performance
loss is not specified by the manufacturer, then either of these may be derived from the product
description and documentation, and by what the user may reasonably expect from the equipment if
used as intended.
Performance criterion B
After the test, the equipment shall continue to operate as intended without operator intervention. No
degradation of performance or loss of function is allowed, after the application of the phenomena
below a performance level specified by the manufacturer, when the equipment is used as intended.
The performance level may be replaced by a permissible loss of performance. During the test,
degradation of performance is allowed. However, no change of operating state or stored data is
allowed to persist after the test. If the minimum performance level (or the permissible performance
loss) is not specified by the manufacturer, then either of these may be derived from the product
description and documentation, and by what the user may reasonably expect from the equipment if
used as intended.
Performance criterion C
The equipment shall continue to operate as intended without operator intervention. No degradation
of performance or loss of function is allowed below a performance level specified by the
manufacturer when the equipment is used as intended. The performance level may be replaced by a
permissible loss of performance. If the minimum performance level or the permissible performance
loss is not specified by the manufacturer, then either of these may be derived from the product
description and documentation, and by what the user may reasonably expect from the equipment if
used as intended.
Performance criterion B
After the test, the equipment shall continue to operate as intended without operator intervention. No
degradation of performance or loss of function is allowed, after the application of the phenomena
below a performance level specified by the manufacturer, when the equipment is used as intended.
The performance level may be replaced by a permissible loss of performance. During the test,
degradation of performance is allowed. However, no change of operating state or stored data is
allowed to persist after the test. If the minimum performance level (or the permissible performance
loss) is not specified by the manufacturer, then either of these may be derived from the product
description and documentation, and by what the user may reasonably expect from the equipment if
used as intended.
Performance criterion C
Loss of function is allowed, provided the function is self-recoverable, or can be restored by the
operation of the controls by the user in accordance with the manufacturer’s instructions. Functions,
and/or information stored in non-volatile memory, or protected by a battery backup, shall not be lost.
operation of the controls by the user in accordance with the manufacturer’s instructions. Functions,
and/or information stored in non-volatile memory, or protected by a battery backup, shall not be lost.
Ident. Nr.:
114383
Date:
2008-11-09
114383 EMC TRF.doc
page 7 of 38
3 General
information
3.1 Description of Equipment under test (EUT)
Type of equipment
Table top
Floor standing
Combination
Floor standing
Combination
The equipment under test (EUT) is a TWO-PIECE DESKTOP SPEAKER SYSTEM .
And model name is Duet II
The input spec of the Adapter:
M/N: S024EU1800120
Input: AC 100-240V, 50/60Hz, 600mA
Output: DC18.0V, 1200mA
3.2 Measurement Uncertainly
Radiated Emission Test : 30MHz-1000MHz 4.5dB
1GHz-18GHz 4.6dB
Conducted Emission Test :
1GHz-18GHz 4.6dB
Conducted Emission Test :
9KHz-30MHz 3.5dB
3.3 Test Mode (TM)
TM 1)
230V AC 50Hz
Audio in Connect to PC
Main Auxiliary Equipments list as below：
Equipment
Type
Serial No.
Manufacturer
Lines
Notebook PC
2647
99-F48CO
IBM
N/A
Adapter of Notebook PC
AA21070
---
IBM
Input line：1.4m unscreened
Output line：1.0m unsreened
Output line：1.0m unsreened
Print
BJC-265SP
EVX81604 CANON
N/A
Adapter for Print
AD-300
--
CANON
Input line：1.0m unscreened
Output line：1.8m unscreened
Output line：1.8m unscreened
MODEM TM-EC5656V
034024060
09
09
TP-Link
Signal line：1.1m screened
Adaptor for modem
EI-41-AD9010
---
---
Output line：1.6m unscreened
With one ferrite core
With one ferrite core
3.4 Climatic conditions
parameter
admissible range
actual range
Ambient temperature
15 °C - 35 °C
26-27°C
O.K.
Relative humidity
30 % - 60 %
45-52%
O.K.
Atmospheric pressure
86-106kPa
101.2 kPa -101.3kPa
O.K.
Ident. Nr.:
114383
Date:
2008-11-09
114383 EMC TRF.doc
page 8 of 38
3.5 Testing location
Shenzhen Academy of Metrology and Quality Inspection (SMQ) Guangdong EMC Compliance
Testing Center.
Testing Center.
–ELA 502
Bldg. of Shenzhen Academy of Metrology and Quality Inspection , Longzhu Road, Nanshan District,
Shenzhen, China.
Shenzhen, China.
All tests have been supervised by a Nemko engineer.
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