DOWNLOAD Sharp LC-22LE510K (serv.man2) Service Manual ↓ Size: 24.07 MB | Pages: 127 in PDF or view online for FREE

Model
LC-22LE510K (serv.man2)
Pages
127
Size
24.07 MB
Type
PDF
Document
Service Manual
Brand
Device
TV / LCD
File
lc-22le510k-sm2.pdf
Date

Sharp LC-22LE510K (serv.man2) Service Manual ▷ View online

53
LC-19LE510
LC-22LE510
LC-24LE510
13. SCALER AND LVDS SOCKETS 
13.1.
LVDS sockets Block Diagram
13.2.
Panel Supply Switch Circuit
This switch is used to open and close panel supply of TCON. It is controlled by port of main μController. 
Also with this circuit panel sequence could be adjusted correctly. 3 panel supplies are connected to this 
circuit. All of them are optional according to panels.
12.
12.1
12.2
54
LC-19LE510
LC-22LE510
LC-24LE510
55
LC-19LE510
LC-22LE510
LC-24LE510
14. NAND FLASH MEMORY - MX25L1005 (U158)
14.1.
General Description
MX25L1005 is a CMOS 1,048,576 bit serial Flash memory, which is configured as 131,072 x 8 internally. 
The MX25L1005 feature a serial peripheral interface and software protocol allowing operation on a simple 
3-wire bus. The three bus signals are a clock input (SCLK), a serial data input (SI), and a serial data output 
(SO). SPI access to the device is enabled by CS# input. The MX25L1005 provide sequential read operation 
on whole chip. After program/erase command is issued, auto program/ erase algorithms which program/ 
erase and verify the specified page or sector/block locations will be executed. Program command is 
executed on page (256 bytes) basis, and erase command is executes on chip or sector(4K-bytes) or 
block(64K-bytes). To provide user with ease of interface, a status register is included to indicate the status 
of the chip. The status read command can be issued to detect completion status of a program or erase 
operation via WIP bit. When the device is not in operation and CS# is high, it is put in standby mode and 
draws less than 10uA DC current. The MX25L1005 utilize MXIC's proprietary memory cell, which reliably 
stores memory contents even after 100,000 program and erase cycles.
14.2.
Features
Serial Peripheral Interface (SPI) compatible -- Mode 0 and Mode 3
1,048,576 x 1 bit structure
32 Equal Sectors with 4K byte each, Any Sector can be erased individually
2 Equal Blocks with 64K byte each, Any Block can be erased individually
Single Power Supply Operation
2.7 to 3.6 volt for read, erase, and program operations
Latch-up protected to 100mA from -1V to Vcc +1V
Low Vcc write inhibit is from 1.5V to 2.5V
14.3.
Absolute Maximum Ratings
RATING
VALUE
Ambient Operating Temperature
0°C to 70°C
Storage Temperature
-55°C to 125°C
Applied Input Voltage
-0.5v to 4.6v
Applied Output Voltage
-0.5v to 4.6v
VCC to Ground Potential
-0.5v to 4.6v
14.4.
Pinning
8-PIN SOP (150mil)
SYMBOL
DESCRIPTION
CS#
Chip select
SI
Serial Data Input
SO
Serial Data Output
SCLK
Clock Input
HOLD#
Hold, to pause the device without 
deselecting the device
VCC
+3.3v Power Supply
GND
Ground
14.4.
Pinning
8-PIN SOP (150mil)
SYMBOL
DESCRIPTION
CS#
Chip select
SI
Serial Data Input
SO
Serial Data Output
SCLK
Clock Input
HOLD#
Hold, to pause the device without 
deselecting the device
VCC
+3.3v Power Supply
GND
Ground
13.4
13.2
13.3
13.1
13.
56
LC-19LE510
LC-22LE510
LC-24LE510
15. NAND FLASH MEMORY – NAND512XXA2C (U162)
15.1.
General Description
The NAND flash 528-byte/ 264-word page is a family of non-volatile flash memories that uses the single 
level cell (SLC) NAND technology. It is referred to as the small page family.
The NAND512R3A2C, NAND512R4A2C, and NAND512W3A2C have a density of 512 Mbits and operate with 
either a 1.8 V or 3 V voltage supply. The size of a page is either 528 bytes (512 + 16 spare) or 264 words 
(256 + 8 spare) depending on whether the device has a x8 or x16 bus width.
The address lines are multiplexed with the Data Input/output signals on a multiplexed x8 or x16 
input/output bus. This interface reduces the pin count and makes it possible to migrate to other densities 
without changing the footprint.
To extend the lifetime of NAND flash devices it is strongly recommended to implement an error 
correction code (ECC). The use of ECC correction allows to achieve up to 100,000 program/erase cycles 
for each block. A write protect pin is available to give a hardware protection against program and erase 
operations.
15.2.
Features
High density NAND flash memories
512-Mbit memory array
Cost effective solutions for mass storage applications
NAND interface
x8 or x16 bus width
Multiplexed address/ data
Supply voltage: 1.8 V, 3 V
Page size
x8 device: (512 + 16 spare) bytes
x16 device: (256 + 8 spare) words
Block size
x8 device: (16K + 512 spare) bytes
x16 device: (8K + 256 spare) words
Page read/program
Random access: 12 μs (3 V)/15 μs (1.8 V) (max)
Sequential access: 30 ns (3 V)/50 ns (1.8 V) (min)
Page program time: 200 μs (typ)
Copy back program mode
Fast block erase: 2 ms (typ)
Status register
14.
14.2
14.1
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