Sony MEX-BT5700U / MEX-BT5750U Service Manual ▷ View online
MEX-BT5700U/BT5750U
17
3-9. CHASSIS (OP) ASSY
3-10. CHUCKING ARM SUB ASSY
chassis (OP) assy
tension spring (KF)
gear (LE1)
lever (D)
slider (R)
chucking arm sub assy
spring
Note 1: Have this portion receive the chassis.
Note 1: Have this portion receive the chassis.
Note 2: Be careful not to touch the turn table.
MEX-BT5700U/BT5750U
18
3-11. SLED MOTOR ASSY
sled motor assy
sled motor assy
spring
spring
stand
(bottom view)
(bottom view)
stand
turn table
three serration screws
(M
(M
2
× 3)
three
serration
screws
(M
2
× 3)
Note 1: Place the stand with care not to touch the turn table.
Note 2:
Never remove these parts since they were adjusted.
Never remove these parts since they were adjusted.
Note for Assembly
Note 3: Take care to prevent the chassis from being bent
when tightening the three machine screws.
bearing (F)
bearing (R)
MEX-BT5700U/BT5750U
19
3-12. OPTICAL PICK-UP BLOCK
3-13. OPTICAL PICK-UP
optical pick-up block
Note: Be careful not to touch the lens and hologram
terminal when removing the optical pick-up block.
(bottom view)
There is space at the end of the
leaf spring (sub guide) to avoid
contact with the slide.
leaf spring (sub guide) to avoid
contact with the slide.
pan tapping screw
(M
(M
1.4
× 2.5)
leaf spring (sub guide)
leaf spring (OP)
optical pick-up
lead screw assy
Notes for Assembly
Prevent the end of the
leaf spring (sub guide) from being
in contact with the OP slide base.
leaf spring (sub guide) from being
in contact with the OP slide base.
Prevent the end of the
leaf spring (sub guide) from being
in contact with the OP slide base.
leaf spring (sub guide) from being
in contact with the OP slide base.
(bottom view)
MEX-BT5700U/BT5750U
20
SECTION 4
TEST MODE
SETTING THE TEST MODE
Note: When the test mode is set, “Visibility” setting in the Bluetooth
Menu is set to “Hide”.
Record customer’s “Visibility” setting beforehand when you use the
test mode by service.
Return the “Visibility” setting to former state (state that the cus-
tomer was setting) after the test mode ends.
Setting method:
1. Press the [OFF] button to turn the power off.
2. Press the [4]
1. Press the [OFF] button to turn the power off.
2. Press the [4]
→ [5] → [1] buttons sequentially (the [1] button
is pressed for two seconds).
3. It is set to the test mode, and all segments of the fl uorescent
indicator tube light.
Releasing method:
Press the [OFF] button.
Press the [OFF] button.
MICROPHONE AUDIO LOOPBACK
To confi rm the state of the external microphone/internal micro-
phone used when a handsfree function is used, the microphone
audio is output from the speaker.
The breakdown judgment of the microphone can be done without
connecting H/F with the cellular phone.
To confi rm the state of the external microphone/internal micro-
phone used when a handsfree function is used, the microphone
audio is output from the speaker.
The breakdown judgment of the microphone can be done without
connecting H/F with the cellular phone.
Procedure:
1. Enter the test mode.
2. Press the [SOURCE] button to select the Bluetooth Phone
1. Enter the test mode.
2. Press the [SOURCE] button to select the Bluetooth Phone
function.
3. On/off of the microphone audio loopback function changes
whenever the [2] button is pressed (The item of the “Loop-
back” changes into “on”/“off”).
back” changes into “on”/“off”).
THE EXTERNAL MICROPHONE/INTERNAL
MICROPHONE COMPULSION CHANGEOVER
the external microphone/internal microphone are compulsorily
switched regardless of the state of the external microphone detec-
tion, and each microphone can be confi rmed.
MICROPHONE COMPULSION CHANGEOVER
the external microphone/internal microphone are compulsorily
switched regardless of the state of the external microphone detec-
tion, and each microphone can be confi rmed.
Procedure:
1. Enter the test mode.
2. Press the [SOURCE] button to select the Bluetooth Phone
1. Enter the test mode.
2. Press the [SOURCE] button to select the Bluetooth Phone
function.
3. The external microphone/internal microphone changes when-
ever the [3] button is pressed (The item of the “MIC” changes
into “External”/“Internal”).
into “External”/“Internal”).
THE EXTERNAL MICROPHONE DETECTION
STATE DISPLAY
Connected confi rmation of the external microphone detection line
is done.
The trouble that doesn't change into an external microphone occurs
when this detection circuit is broken.
STATE DISPLAY
Connected confi rmation of the external microphone detection line
is done.
The trouble that doesn't change into an external microphone occurs
when this detection circuit is broken.
Procedure:
1. Enter the test mode.
2. Press the [SOURCE] button to select the Bluetooth Phone
1. Enter the test mode.
2. Press the [SOURCE] button to select the Bluetooth Phone
function.
3. The detection state of the external microphone is displayed in
the fl uorescent indicator tube (“Non” or “Detected” are dis-
played on the item of “MIC”).
played on the item of “MIC”).
In this state, when the external microphone is pulled out, the
beep sound is output.
beep sound is output.
EEPROM STATE CHECK
Connected line of the EEPROM (connected line of the EEPROM
and Bluetooth micro controller) and state of the EEPROM memory
(phonebook memory) are confi rmed.
Connected line of the EEPROM (connected line of the EEPROM
and Bluetooth micro controller) and state of the EEPROM memory
(phonebook memory) are confi rmed.
Procedure:
1. Enter the test mode.
2. Press the [SOURCE] button to select the Bluetooth Phone
1. Enter the test mode.
2. Press the [SOURCE] button to select the Bluetooth Phone
function.
3. When the [4] button is pressed, state of connected line of the
EEPROM and state of the EEPROM memory are displayed on
the item of “EEPROM”.
the item of “EEPROM”.
ALL OK
: State of connected line of the EE-
PROM and state of the EEPROM
memory are OK (usual state).
memory are OK (usual state).
NG
: State of connected line of the EE-
PROM and state of the EEPROM
memory are NG (state of communi-
cation with memory).
memory are NG (state of communi-
cation with memory).
OK UNFROMATTED : State of connected line of the EE-
PROM and state of the EEPROM
memory are OK, and the memory is
not formatted (state using new mem-
ory).
memory are OK, and the memory is
not formatted (state using new mem-
ory).
The beep sound is output for “ALL OK” or “OK UNFRO-
MATTED”.
MATTED”.
The format is done by initialization in the state of “OK UN-
FROMATTED”.
FROMATTED”.
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