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TH-50PHW6BX TH-50PHW6EX TH-50PHD6EX TH-50PHD6BX TH-50PHD6UY
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Service Manual
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Plasma / HIGH DEFINITION PLASMA DISPLAY
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Panasonic TH-50PHW6BX / TH-50PHW6EX / TH-50PHD6EX / TH-50PHD6BX / TH-50PHD6UY Service Manual ▷ View online

2.1.1 Leakage Current Cold Check
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1.  Unplug the AC cord and connect a jumper between the two prongs on the plug.
2.  Measure the resistance value, with an ohmmeter, between the jumpered AC plug and each 
exposed metallic cabinet part on the equipment such as screwheads, connectors, control shafts, 
etc. When the exposed metallic part has a return path to thechassis, the reading should be 
between 1M
 and 5.2M
.
When the exposed metal does not have a return path to the chassis, the reading must be
.
Figure 1
 
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2.1.2 Leakage Current Hot Check (See 
Figure 1
 .) 
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1.  Plug the AC cord directly into the AC outlet. Do not use an isolation transformer for this 
check.
2.  Connect a 1.5k
, 10 watts resistor, in parallel with a 0.15μF capacitors, between each 
exposed metallic part on the set and a good earth ground such as a water pipe, as shown in 
Figure 1
 .
3.  Use an AC voltmeter, with 1000 ohms/volt or more sensitivity, to measure the potential across 
the resistor.
4.  Check each exposed metallic part, and measure the voltage at each point.
5.  Reverse the AC plug in the AC outlet and repeat each of the above measurements.
6.  The potential at any point should not exceed 0.75 volts RMS. A leakage current tester 
(Simpson Model 229 or equivalent) may be used to make the hot checks, leakage current must 
not exceed 1/2 milliamp. In case a measurement is outsideof the limits specified, there is a 
possibility of a shock hazard, and the equipment should be repaired and rechecked before it is 
returned to the customer.
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3 Prevention of Electro Static Discharge (ESD) to Electrostatically 
Sensitive (ES) Devices
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Some semiconductor (solid state) devices can be damaged easily by static electricity. Such components commonly are called Electrostatically Sensitive (ES) Devices. 
Examples of typical ES devices are integrated circuits and some field-effect transistorsand semiconductor "chip" components. The following techniques should be used 
to help reduce the incidence of component damage caused by electro static discharge (ESD).
1.  Immediately before handling any semiconductor component or semiconductor-equipped assembly, drain off any ESD on your body by touching a known earth 
ground. Alternatively, obtain and wear a commercially available discharging ESD wrist strap, whichshould be removed for potential shock reasons prior to 
applying power to the unit under test.
2.  After removing an electrical assembly equipped with ES devices, place the assembly on a conductive surface such as alminum foil, to prevent electrostatic 
charge buildup or exposure of the assembly.
3.  Use only a grounded-tip soldering iron to solder or unsolder ES devices.
4.  Use only an anti-static solder removal device. Some solder removal devices not classified as "anti-static (ESD protected)" can generate electrical charge 
sufficient to damage ES devices.
5.  Do not use freon-propelled chemicals. These can generate electrical charges sufficient to damage ES devices.
6.  Do not remove a replacement ES device from its protective package until immediately before you are ready to install it. (Most replacement ES devices are 
packaged with leads electrically shorted together by conductive foam, alminum foil or comparableconductive material).
7.  Immediately before removing the protective material from the leads of a replacement ES device, touch the protective material to the chassis or circuit assembly 
into which the device will be installed.
Caution
 
Be sure no power is applied to the chassis or circuit, and observe all other safety precautions.
8.  Minimize bodily motions when handling unpackaged replacement ES devices. (Otherwise hamless motion such as the brushing together of your clothes fabric 
or the lifting of your foot from a carpeted floor can generate static electricity (ESD) sufficient todamage an ES device).
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