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Design and Speciﬁcations are subject to change without notice.
Weight and Dimensions shown are approximate.
damaged by the short circuit.
as a water pipe, as shown in Figure 1.
4. Check each exposed metallic part, and measure the voltage at each point.
5. Reserve the AC plug in the AC outlet and repeat each of the above measure.
mA d. c.
The limit value U1 = 35 V (peak) for a. c. correspond to the value 70 mA (peak) a. c. for frequencies greater than 100 kHz.
Electrostatically Sensitive (ES) Devices. Examples of typical ES devices are integrated circuits and some ﬁeld-effect transistors and
semiconductor „chip” components. The following techniques should be used to help reduce the incidence of component damage
caused by electro static discharge (ESD).
body by touching a known earth ground. Alternatively, obtain and wear a commercially available discharging ESD wrist strap,
which should be removed for potential shock reasons prior to applying power to the unit under test.
generate electrical charge sufﬁcient to damage ES devices.
replacement ES devices are packaged with leads electrically shorted together by conductive foam, alminum foil or comparable
to the chassis or circuit assembly into which the device will be installed.
Be sure no power is applied to the chassis or circuit, and observe all other safety precautions.
ing together of your clothes fabric or the lifting of your foot from a carpeted ﬂoor can generate static electricity (ESD) sufﬁcient
to damage an ES device).