JBL GTO 755.6 (serv.man3) EMC - CB Certificate ▷ View online
Page 1 of 17
File No.: E042R-021
It should not be reproduced except in full, without the written approval of ONETECH.
EMC-008 (Rev.0)
HEAD OFFICE
: #505 SK APT. Factory 223-28, Sangdaewon 1 Dong, Jungwon-Gu, Seongnam-City, Gyunggi-Do, 462-121, Korea
(TEL:
+82-31-746-8500, FAX: +82-31-746-8700
)
EMC Testing Dept :
426-1
Daessangryung-Ri, Chowol-Myun, Gwangju-City, Gyunggi-Do 464-860 Korea. (TEL: +82-31-765-8289, FAX: +82-31-766-2904)
ONETECH
Testing & Evaluation Lab.
IMMUNITY TEST REPORT
Test report file number
: E042R-021
Applicant
: Harman Consumer Group.
Address
: New York 250 Crossways Park West Woodbury, NY 11797, USA
Manufacturer
: Chunglam Digital Co., Ltd.
Address
: #453-4, Yongduri, Gongdo-Eup, Ansung-Si, Kyunggi-Do, 456-821, Korea
Type of Equipment
: Automotive Power Boost Amplifier
Model Name. :
GTO 755.6
Multiple Model Name.
: N/A
Serial number
: N/A
Total page of Report
: 17 pages (including this page)
Date of Incoming
: January 20, 2004
Date of Issuing
: February 04, 2004
SUMMARY
The equipment complies with the standards; EN55 020: 1994 + A11: 96 + A12: 99 + A13: 99 and A14: 99.
This test report only contains the result of a single test of the sample supplied for the examination.
It is not a general valid assessment of the features of the respective products of the mass-production.
Prepared by:
Reviewed
by:
Young-Min, Choi/ Project Engineer
Gea-Won, Lee / Chief Engineer
EMC Div.
EMC Div.
ONETECH Corp.
ONETECH Corp.
SEMKO Approved Laboratory
Page 2 of 17
File No.: E042R-021
It should not be reproduced except in full, without the written approval of ONETECH.
EMC-008 (Rev.0)
HEAD OFFICE
: #505 SK APT. Factory 223-28, Sangdaewon 1 Dong, Jungwon-Gu, Seongnam-City, Gyunggi-Do, 462-121, Korea
(TEL:
+82-31-746-8500, FAX: +82-31-746-8700
)
EMC Testing Dept :
426-1
Daessangryung-Ri, Chowol-Myun, Gwangju-City, Gyunggi-Do 464-860 Korea. (TEL: +82-31-765-8289, FAX: +82-31-766-2904)
ONETECH
Testing & Evaluation Lab.
CONTENTS
PAGE
1. APPLICANT AND MANUFACTURER INFORMATION ...........................................................................................4
2. TEST SUMMARY..............................................................................................................................................................4
2.1
T
EST STANDARDS AND RESULTS
.....................................................................................................................................4
2.2
A
DDITIONS
,
DEVIATIONS
,
EXCLUSIONS FROM STANDARDS
...........................................................................................4
2.3
P
URPOSE OF THE TEST
...................................................................................................................................................4
2.4
C
RITERION DESCRIPTION
...............................................................................................................................................4
2.5
T
EST
F
ACILITY
...............................................................................................................................................................5
3. EUT (EQUIPMENT UNDER TEST) ...............................................................................................................................6
3.1
I
DENTIFICATION OF
EUT...............................................................................................................................................6
3.2
A
DDITIONAL INFORMATION ABOUT THE
EUT ..............................................................................................................6
3.3
P
ERIPHERAL EQUIPMENT
...............................................................................................................................................6
3.4
M
ODE OF OPERATION DURING THE TEST
.......................................................................................................................7
3.5
A
LTERNATIVE TYPE
(
S
)/
MODEL
(
S
);
ALSO COVERED BY THIS TEST REPORT
. ................................................................7
4. EUT MODIFICATIONS ...................................................................................................................................................7
5. ELECTROSTATIC DISCHARGE IMMUNITY TEST.................................................................................................8
5.1
O
PERATING ENVIRONMENT
...........................................................................................................................................8
5.2
T
EST SET
-
UP
...................................................................................................................................................................8
5.3
M
EASUREMENT UNCERTAINTY
......................................................................................................................................8
5.4
T
EST EQUIPMENT USED
..................................................................................................................................................8
5.5
T
EST DATA
......................................................................................................................................................................9
6. RADIATED RF-ELECTROMAGNETIC FIELD IMMUNITY TEST ......................................................................10
6.1
O
PERATING ENVIRONMENT
.........................................................................................................................................10
6.2
T
EST SET
-
UP
.................................................................................................................................................................10
6.3
M
EASUREMENT UNCERTAINTY
....................................................................................................................................10
6.4
T
EST EQUIPMENT USED
................................................................................................................................................10
6.5
T
EST DATA
....................................................................................................................................................................11
7. ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST..............................................................................12
7.1
O
PERATING ENVIRONMENT
.........................................................................................................................................12
Page 3 of 17
File No.: E042R-021
It should not be reproduced except in full, without the written approval of ONETECH.
EMC-008 (Rev.0)
HEAD OFFICE
: #505 SK APT. Factory 223-28, Sangdaewon 1 Dong, Jungwon-Gu, Seongnam-City, Gyunggi-Do, 462-121, Korea
(TEL:
+82-31-746-8500, FAX: +82-31-746-8700
)
EMC Testing Dept :
426-1
Daessangryung-Ri, Chowol-Myun, Gwangju-City, Gyunggi-Do 464-860 Korea. (TEL: +82-31-765-8289, FAX: +82-31-766-2904)
ONETECH
Testing & Evaluation Lab.
7.2
T
EST SET
-
UP
.................................................................................................................................................................12
7.3
M
EASUREMENT UNCERTAINTY
....................................................................................................................................12
7.4
T
EST EQUIPMENT USED
................................................................................................................................................12
7.5
T
EST DATA
....................................................................................................................................................................13
APPENDIX I - ESD TEST POINT & TEST RESULT.....................................................................................................14
APPENDIX II - TEST SET-UP PHOTO: (ESD)...............................................................................................................15
APPENDIX III - TEST SET-UP PHOTO: (RF E- FIELD) .............................................................................................16
APPENDIX IV - TEST SET-UP PHOTO: (EFT/BURST)...............................................................................................17
Page 4 of 17
File No.: E042R-021
It should not be reproduced except in full, without the written approval of ONETECH.
EMC-008 (Rev.0)
HEAD OFFICE
: #505 SK APT. Factory 223-28, Sangdaewon 1 Dong, Jungwon-Gu, Seongnam-City, Gyunggi-Do, 462-121, Korea
(TEL:
+82-31-746-8500, FAX: +82-31-746-8700
)
EMC Testing Dept :
426-1
Daessangryung-Ri, Chowol-Myun, Gwangju-City, Gyunggi-Do 464-860 Korea. (TEL: +82-31-765-8289, FAX: +82-31-766-2904)
ONETECH
Testing & Evaluation Lab.
1. APPLICANT AND MANUFACTURER INFORMATION
-. Applicant
: Harman Consumer Group.
-. Address
: New York 250 Crossways Park West Woodbury, NY 11797, USA
-. Manufacturer
: Chunglam Digital Co., Ltd.
-. Address
: #453-4, Yongduri, Gongdo-Eup, Ansung-Si, Kyunggi-Do, 456-821, Korea
-. Name of contact
: Mr. Jin-Ho, Jung/ Supervisor
-. Telephone No.
: +82-31-656-7650
-. Fax No.
: +82-31-656-9688
2. TEST SUMMARY
2.1 Test standards and results
STANDARDS RESULTS
Electrostatic Discharge Immunity
Met Criterion A / PASS
Radiated RF E-Field (900MHz +/- 5MHz)
Met Criterion A / PASS
EN 55 020: 1994 + A11: 96 + A12: 99
+ A13: 99 + A14: 99
Electrical Fast Transient/Burst Immunity
Met Criterion A / PASS
2.2 Additions, deviations, exclusions from standards
No additions, deviations or exclusions have been made from standard.
2.3 Purpose of the test
To determine whether the equipment under test fulfills the EMC-immunity requirements of the standards stated in section
2.1.
2.4 Criterion description
Criterion Description
A
No loss of performance or function.
B
The apparatus shall continue operate as intended after test. No degradation of performance or loss
of function is allowed below a performance level specified by the manufacturer, when the
apparatus is used as intended.
C
Temporary loss of function or performance, which is provided the function, is self-recoverable or
can be restored by the operation of the controls.
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